用于空间可配置计算的Virtex FPGA和ZBT SRAM的辐射测试结果
A comprehensive Single Event Effects (SEE) characterization of advanced commercial technologies was conducted using the heavy-ion test facility at Texas A&M. The components evaluated included a 322,000 gate Virtex reprogrammable FPGA (XQVR300) from Xilinx, and several manufacturers’ versions of 4Mbit Zero Bus Turnaroundä (ZBTä) SRAMs. The SRAMs all unfortunately latched-up at or below an LET of 60 MeV-cm2/mg and no further testing was done. However, the Virtex FPGA was immune to single event latch-up up to an LET of 125 MeV-cm2/mg. Detailed single event upset testing was then done in both static as well as dynamic operating conditions to better understand the upset modes and develop mitigation strategies for a space based reconfigurable computing application. The upset sensitivity as well as detection and mitigation techniques are discussed. The results indicate that the Virtex FPGA is a candidate for many satellite applications.
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