新闻要点：
日本半导体的credence系统为高集成度系统级封装和片上系统设备测试研发了多波混合信号设备。该设备将多个设备功能集成在一个多道任意波形发生器和数字信号转换器单元里，可对音频SIP和SOC进行并行共发测试。
摘要：
- 测试平台包含了即插即用、运行效率和购置成本及其他主要性能。
- 将多波设备集成到平台设计和生产中加速了芯片分类和终期产品测试。
- 多波设备的全并行多道结构使并行测试效率很高，并且数字信号转换器或发生器可软件设为高精度或高频。
Credence expands Diamond platform to offer multisite mixed-signal
test-- Test & Measurement World, 12/6/2007 4:49:00 AM
Credence Systems at Semicon Japan introduced the MultiWave mixed-signal instrument for multisite
testing of highly integrated system-in-package (SIP) and
system-on-chip (SOC) devices used in mainstream consumer
applications. The MultiWave instrument integrates the functionality
of multiple instruments in one multichannel arbitrary waveform
generator and digitizer unit, allowing for fully parallel and
concurrent testing of audio and video SIP and SOC components.
Especially effective in high-mix product environments because of
its plug-and-play configurability, the MultiWave instrument has
already been adopted in high volume manufacturing by leading
semiconductor manufacturers in the consumer electronics market as
well as outsourced assembly and test (OSAT) providers and
characterization labs.
"One of our principles to improving test economics is to ensure
that the test system is not adding overhead cost," stated Amir
Aghdaei, senior VP of field operations and marketing at Credence.
"In addition to required performance, plug-and-play
configurability, operational efficiency, and acquisition cost of
the test system are very important considerations for our customers
in the price-sensitive mainstream consumer electronics market.
These considerations become even more important as more and more
device manufacturers form partnerships with OSATs for wafer sort
and final test. In a high-mix product environment, for example,
fast automatic calibration, diagnostics, and configurability can
provide a huge advantage in accelerating the ramp to high volume
production to meet time-to-market goals. Now, with the addition of
the MultiWave instrument, the Diamond test platform offers
customers the optimum test platform to realize the advantages of
faster time-to-market in a very cost-effective and efficient
manner."
"Our number one priority is to ramp to volume production and meet
our time-to-market goals as rapidly and cost-effectively as we
can," stated Patrick Sauvage, managing director of the SPACE/ULC
product line, ASIC Business Management, at Atmel Rousset, France.
"The complex ASICs that we manufacture today have a very high level
of analog/mixed-signal content. By rapidly integrating several
MultiWave instruments in our Diamond engineering and production
platforms, we have been able to accelerate our wafer sort and final
production test, including correlation and validation with our OSAT
partners, with highly parallel operations and maximum flexibility.
We achieved final test production of one of our key mixed-signal
ASICs, and produced over one million devices, in a few weeks."
The MultiWave instrument's fully parallel multichannel architecture
delivers very efficient parallel test capability. Tailored for
multisite testing—with parallel signal generation and sampling of
analog signals—the instrument's four independent wide-range
generator channels and four independent digitizer channels allow
for concurrent testing of video and audio components, fully
synchronized to the digital components. These channels are designed
to generate AC or DC signals in a wide frequency range from high
precision audio to high speed video applications. Each digitizer or
generator path can easily be software-configured as a
high-precision or high-frequency signal path on demand. Sampling
rates range from 0 to 250 megasamples per second (Msample/s) with
resolutions from 16-bit for video and up to 24-bit for high
precision audio tests.
www.credence.com
当前离线
