The FIRST Fully Integrated ATE Instrument for Characterization and
High-Volume Production Test of Wireless Device Applications Building on four generations of Teradyne wireless test solutions
and over 30 years of RF test experience, Teradyne’s new UltraWave™
wireless test instrument delivers a flexible test solution for the
most demanding RF requirements today with the performance headroom
for testing the next generation of wireless devices. It spans the
broadest range of complex RFIC and RFSoC wireless device
applications, including: •Wireless
LAN •4G cellular •Cellular •MIMO •Bluetooth •WiMax •Set-top box
(STB) •Ultrawideband
UniversalPortArchitecture with Higher Port Count UltraWave’s unique universal port architecture provides 12 GHz
source and measure with uniform test capability on every port.
UltraWave can be configured with up to 64 universal RF ports per
instrument set and multiple instruments per system, easily
providing parallel octal site test without needing complex DIB
circuitry for high port count devices, such as WEDGE transceivers
and 802.11n applications. Faster Waveform Synthesis & Analysis UltraWave incorporates Teradyne’s patent-pending
TVS™ synthesizer technology that provides fast settling time
to 0.07dB within 1 millisecond and superior phase noise. UltraWave
delivers DSP per receiver (with calculations performed in less
than 20 microseconds). UltraWave Wireless Test Instrument – Features &
Specifications•Unique Universal Port architecture delivers uniform performance on
every port –Up to 64 universal RF ports per instrument set –Multiple instrument sets per system –50 MHz to 12 GHz Source and Measure –TVS Technology for the fastest settling time and lowest phase noise of any ATE wireless instrument –Parallel stimulus and measure capability –Noise source per port –Vector network analyzer –DSP per receiver–Integrated AWG for modulated signal generation •Integrated Low Phase Noise Reference Source –4 DUT LO source pins (50 MHz to 6 GHz) –4 DUT Reference source pins (8 MHz to 100 MHz) •Multisite Software –Graphical on-screen debug with Smith charts, vector scopes,
Constellation, and EVM