下一代串行数据分析——力科推出基于SDA II的SDA 7 Zi 系列示波器 纽约州切斯纳特，2008年10月1日。基于SDA II技术的力科SDA 7 Zi 重新定义了示波器的串行数据分析能力。当许多示波器还在做一致性测试的时候，力科的SDA II带来的五种新的调试方法已超越了一致性测试的范畴。这些方法有：1）在眼图上直接预测误码率；2）提供了两种抖动分解的方法，可以用数字表示和更富洞察力的方式显示；3）提供了直观的结合了眼图和抖动分解主界面显示的快速察看功能；4）以最快超过其他示波器50倍的速度迅速测量数百万个比特位；5）整合的一致性测试和SDA II调试工具可以全面的追踪查找到故障的根源。对于一致性测试，力科的QualiPHY™提供了最好的自动化一致性测量解决方案，可以配置和存档标准的串行数据测试。然而，当一致性测试失败时，工程师们需要更高级的工具识别和解决这些问题，没有任何工具箱可以匹敌力科最新推出的基于SDA II的SDA 7 Zi示波器。
IsoBER 直接预测误码率（ Bit Error Rate）
SDA II 工具箱包括 IsoBER™, 这种分析工具可以外推眼图数据并把误码率线直接显示在眼图上，帮助工程师快速判定眼的最小张开度并有助于通过分析垂直眼的闭合度来检定串扰，而像模板测试这样的标准眼图技术由于缺少对于垂直噪声和抖动的定量分析是不可能实现这些测量的。 “IsoBER 可以通过眼图分析把用其它方式看不到的问题展示出来，” 产品经理Christopher Busso说， “SDA 7 Zi系列由于把创新的新技术与X-Stream II软件架构结合在一起而创造了又一个行业第一，它所提供的出色性能、速度与分析能力在当前的示波器市场是无可匹敌的。”
两种分解抖动的方法与多种抖动成分的细分
由于力科的X-Stream® II架构比其它示波器最大快了50倍，这使得抖动分析的两种分解算法第一次可以被同时地计算。传统的分解算法和NQ-Scale分解算法通常说明了串扰或者其它类型固有抖动的情形，而这些固有抖动可能伪装成随机抖动从而导致错误的计算。两种抖动分解方法同时计算并在测量结果出现背离的时候用彩色编码提示用户，这就确保显示的抖动值是正确的，并使用户对他们的测量结果更有信心。Busso 接着说，“随着当今串行数据标准时钟频率的增加，抖动分析已经成为电子设计非常重要的一部分。力科在分析复杂串行数据方面的历史和经验让我们创造性的把多种方法关联起来提供了更精确的抖动测量。”对于串行数据信号的抖动分解，区别随机抖动和固有抖动是鉴别和调试抖动源至关重要的一部分。力科的SDA II提供了直观的抖动分解的图表察看，可以迅速的洞察问题的根源。为了更好的理解固有抖动及其来源，SDA II描绘出Pj、ISI和DDj。周期性抖动的频谱特性可以鉴别出贡献最大周期抖动（Pj）的来源，ISI Plot隔离出贡献了最多码间干扰（ISI）的比特位，DDj的直方图深入洞察数据相关性抖动（DDj）的分布。
更长存储、更先进的工业设计和行业内最广泛的工具箱
力科的SDA 7 Zi基于最新发布的WavePro® 7 Zi系列示波器且标配的存储深度提高了一倍，可以在眼图测量中捕获更多的UI。最快的眼图生成速度和每秒钟捕获最多的UI意味着最短的解决问题的时间。这种速度被应用在同时显示包括眼图、频谱和NQ-Scale抖动分解、TIE、抖动直方图和浴盆曲线的Quick-View中。工程师可以很容易的重新配置Quick-View而看到最多35种不同的测量和6种显示，这得益于示波器中最大分辨率显示的支持。SDA 7 Zi 拥有更先进的工业设计。其业内第一的15.3”宽屏（16：9）高分辨率触摸屏显示器还可以将波形以同样的尺寸和分辨率扩展显示到第二台集成式显示器中，以扩大示波器的工作空间。可分离的前面板允许工程师将其放在被测电路旁边控制示波器。力科新的串行接口总线LSIB，使数据的传输速率比其他方式快了10-100倍。此外，TriggerScan™， WaveScan™和查找罕见事件的特殊模式均缩短了新设计的调试时间。行业内最广泛的工具箱和SDA II串行数据分析使SDA 7 Zi将解决电子设计问题的时间从小时级缩短到分钟级。
欲了解更多，请登录力科公司的网站 (http://www.lecroy.com).
( 李军 美国力科公司深圳代表处 译)
Chestnut Ridge, NY, October 1, 2008 LeCroy's SDA 7 Zi Oscilloscope with SDA II redefines serial data analysis in an oscilloscope. While many oscilloscopes measure compliance, LeCroy's SDA II goes beyond compliance testing with the introduction of five new debugging methodologies that 1) visually predict bit error rate directly on the eye, 2) provide dual methods of decomposing jitter that are presented both numerically and with insightful displays, 3) provide Quick-View, for intuitive combination eye and jitter breakdown master display, 4) measure millions of unit intervals at speeds up to 50 times faster than any other oscilloscope, and 5) integrate both compliance testing and SDA II debugging tools for complete drill down to find the source of the failure. For compliance testing, LeCroy's QualiPHY™ provides the best available automated compliance solution that configures and documents standardized tests. However, when a design fails a compliance test, the engineer needs an advanced set of tools to identify and solve those problems, and no other set of tools can match LeCroy's SDA 7 Zi Oscilloscope with SDA II.
IsoBER Visually Predicts Bit Error Rate
The SDA II toolset includes IsoBER™, an analysis tool that
extrapolates the eye diagram data and displays the lines of Bit
Error Rate directly on the eye. This helps to quickly determine the
minimum eye opening and also is instrumental in detecting
cross-talk by analyzing the vertical eye closure. These
measurements are not possible with standard eye diagram techniques
like Mask testing because those techniques lack quantitative
analysis of vertical noise and jitter.
"IsoBER can display problems with Eye Diagram analysis that were otherwise invisible," said Christopher Busso, Product Marketing Manager. "The SDA 7 Zi with SDA II is another industry-first for LeCroy since the integration of innovative new methodologies and our X-Stream II software architecture can deliver performance, speed and analysis capabilities unmatched anywhere in the oscilloscope market."
Two Methods to Decompose Jitter and Multiple Jitter Breakdown
Displays
Because LeCroy's X-Stream® II architecture is up to 50 times faster
than other oscilloscopes, for the first time the results of two
decomposition algorithms for jitter analysis can be calculated
simultaneously. Both the traditional LECROY CORPORATION Page 2 of 3
spectral and the NQ-Scale decomposition algorithms are used to
account for situations where cross talk, or other types of
deterministic jitter, can masquerade as random jitter and cause
incorrect calculations. The jitter decomposition calculates both
methods simultaneously and alerts the user with a color-coded
warning system only when there is a deviation between the results.
This ensures that the correct jitter values will always be
displayed, and users can be confident in their jitter results.
Busso continued, "With the increasing clock frequencies of today's serial data standards, jitter analysis has become a critical part of electronic design. LeCroy's history and experience in analyzing complex serial data signals enabled us to create and correlate methodologies that provide more accurate measurements of jitter."
Distinguishing between random and deterministic jitter, for example the jitter breakdown of a serial data signal, is a crucial part of being able to identify and debug the sources of jitter. LeCroy's SDA II provides intuitive graphical views of jitter decomposition to quicken insight to the root cause of problems. To understand deterministic jitter values and their sources, SDA II addresses PJ, ISI and DDJ with a Periodic Jitter Spectrum feature that identifies the sources contributing the highest values of Periodic Jitter (PJ), an ISI Plot that isolates bit patterns that contribute the most Intersymbol Interference (ISI), and a DDJ Histogram for deeper insight into the distribution of Data Dependent Jitter (DDJ).
Distinguishing between random and deterministic jitter, for example the jitter breakdown of a serial data signal, is a crucial part of being able to identify and debug the sources of jitter. LeCroy's SDA II provides intuitive graphical views of jitter decomposition to quicken insight to the root cause of problems. To understand deterministic jitter values and their sources, SDA II addresses PJ, ISI and DDJ with a Periodic Jitter Spectrum feature that identifies the sources contributing the highest values of Periodic Jitter (PJ), an ISI Plot that isolates bit patterns that contribute the most Intersymbol Interference (ISI), and a DDJ Histogram for deeper insight into the distribution of Data Dependent Jitter (DDJ).
More Memory, Advanced Industrial Design and Industry's Most
Extensive Toolbox
LeCroy's SDA 7 Zi Series oscilloscopes are based on the recently
released WavePro® 7 Zi Series oscilloscopes and are equipped with
double the standard memory to capture more unit intervals in the
eye diagram. The fastest eye building and the maximum unit
intervals per second means the shortest time to reach a solution.
This speed is applied in a Quick-View display which simultaneously
shows the Eye Diagram, Spectrum and NQ-Scale Jitter Decomposition,
TIE, jitter histogram and Bathtub curve. Quick-View is easily
reconfigured by the engineer to see up to 35 different measurements
and six displays, supported by the largest and highest resolution
display in any oscilloscope.
The SDA 7 Zi features an advanced industrial design with an industry-first 15.3 inch, 16:9 high definition display equipped with a touch screen, and can be extended to an integrated second display, of equal size and resolution, in order to expand the oscilloscope's workspace. The removable front panel allows engineers to place the control-pod next to the circuit under test. LeCroy's new serial interface bus, LSIB, enables data to be transferred 10-100 times faster than any other method. In addition, TriggerScan™ and WaveScan™, special modes for finding rare events, shorten the time to debug a new design. With the industry's most extensive toolbox and SDA II Serial Data Analysis, the SDA 7 Zi can solve electronic design problems within minutes instead of hours.
Engineers and technicians who would like to know more can contact LeCroy at 1-800-5LeCroy (1-800-553-2769) or visit the LeCroy web site (http://www.lecroy.com).
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