博客首页 | 排行榜 |

开源硬件的星星之火

关注嵌入式发展(Arduino MCU FPGA Android RTOS),深度解读电子行业。

个人档案
博文分类
嵌入式仪器将大行其道?  2007-10-31 11:19
 编辑笔记:刚刚结束的ITC展示了一种趋势——测试测量仪器正在走下工作台并被整合到芯片里。事实上这种趋势已经在在之前的一些测试产品中得到印证,如安捷伦和泰克推出的FPGA调试解决方案。在使用这种解决方案的时候,需要将JTAGIP核下载到FPGA中控制各种信号输入,同时输出信号传送到MSO或者逻辑分析仪上,并通过与相应的软件分析相结合从而达到调试FPGA内部电路的目的。

Posted by Rick Nelson on October 25, 2007

Instruments are moving off your bench and into your chips. That’s the message one might have taken away from an International Test Conference address titled “The need for Standard and Efficient Interconnection and Access of Embedded Everything” by Inovys chief scientist Al Crouch. He’s been poking around in other people’s chips, he said, and he’s found a variety of embedded instruments based on technologies from companies including DAFCA, Cisco, ARM, and ASE.


Such instruments are necessary, he said, to help silicon makers keep up with Moore’s law and to serve in applications ranging from debug to yield enhancement to system-level troubleshooting. Dense chips and stacked-die multichip packages, he said, require significant debug infrastructure to get them up and running. As for system-level test, he said that a chip might work fine when it’s plugged into a $10,000 load board connected to a $2 million ATE system. But when you pack it onto a 5x5-in. board with ten other chips and connect it to a $35 power supply, it might turn out not to work so well. Embedded instruments, he said, can provide the only way of finding out exactly what’s going on while avoiding no-trouble-found round trips to a tester.


But the proliferation of embedded instruments, he said, presents its own problems involving the need to communicate with them effectively. He added that second-order effects—embedded instruments within embedded instruments—further complicate matters.


Today’s efforts to communicate with embedded instruments are mainly ad hoc, he said, with debug, yield, and system-troubleshooting personnel pursuing their own agendas without regard to what others are doing. He concluded that the IEEE P1687 internal JTAG initiative can provide an effective way for orderly, standardized embedded-instrument communication and control.

He concluded by saying that chip designers can’t really design just for the chip itself today—they must design for the wafer-level and end-system environment as well, as embedded content continues to grow.

In related ITC news, Asset InterTech announced that it has expanded its embedded-instrument support.

类别:测试测量 |
上一篇:Xpress 技术:Mentor Graphic下一代嵌入式测试技术 | 下一篇:丹纳赫收购泰克是否会导致更多的spin-off?
以下网友评论只代表其个人观点,不代表本网站的观点或立场