编辑笔记：本文时Mentor Graphic发布的最新关于X
press技术白皮书。本白皮书旨在说明,在应对纳米设计挑战时如何利用Xpress技术减少测试时间并压缩测试数据。The new embedded compression hardware Xpress used by TestKompress provides significant improvement in compression of test data and test application time for designs with large numbers of Xs. This paper provides an overview of test quality and cost requirements of nanometer designs, as well as the impact of X sources on test quality. A high-level description of the Xpress hardware is followed by benchmark results from industrial designs of Mentor Graphics' customer partners.
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