TMworld每年一度的这个奖项对于测试测量界来说相当于电影界的奥斯卡，音乐界的格莱美。下面我们就一起来看看今年都有哪些狠角色瓜分了这些奖项。
每一年首尾相接的时候，TMworld就会提名参赛者，角逐共计Best in Test，Test Product of the Year ，Test Engineer of the Year，Test of Time 4项大奖。提名规则不详，无从得知什么样的选手才有资格入围。（听众甲：那你的意思是不是暗箱操作？呃，这个，这个吗，不好说。）。但是获奖规则倒是相当明了简单，读者投票，多者得。其中最受关注的Best in Test在将决出多达15个种类的产品，而获得投票最多的产品则同时获得Test Product of the Year。从这个角度来说，读者，您的喜好将决定该奖项的最后归属。今年的4月1日一如往年，TMworld公布了获奖者。
Test Product of the Year 由NI的Wi-Fi DAQ获得，获奖理由是NI成功的实现了无线界面上实现了数据采集，并解决了安全和传输速度问题。
Test Engineer of the Year 由来自St. Jude Medical 神经部门的Eddie Abshire夺得，获奖理由是其在嵌入式硬件和软件测试方面做出了卓越的表现。
Test of Time 则由Menter Graphics的TestKompress ATPG Toll获得，大家所熟悉的Menter的另一款软件是PADS。
Best in Test 奖项中，大家所熟悉的领域，比如通用仪器由Fluke的287获得，估计是万用表发展到现在任何一个稍大的创新都足以成为亮点；示波器则由LeCroy的WavePro 7Zi夺得，由于去年只有LeCroy对示波器做了换代，相对于其他两个对手，算是做出了比较大的创新，获此殊荣也算是众望所归；而测试软件则由Agilent的VEE拿下，比起国内所熟悉的Labview，VEE要生疏的多，但VEE的功能的确是非常强大，跟Agilent的仪器更是可以无缝链接，非常方便。更多的获奖产品请看下文。
 See also: T&MW Awards Program 2009 Test Engineer of the Year 2009 Best in Test finalists 2009 Test of Time finalists Read other articles from our April 2009 issue |
Here, we present the winners of our annual Best in Test awards, which recognize important and innovative new products and services in the electronics test and measurement industry. We announced the finalists for the Best in Test awards in our December/January issue and asked readers to vote for their favorites. The 2009 Best in Test award winner in each of the 15 product categories is listed below. The overall top vote getter—Wi-Fi Data Acquisition Devices from National Instruments—has been named the Test Product of the Year.
The annual Test of Time award honors a product that continues to provide state-of-the-art service five years or more after its introduction. We named the six finalists for this award in our December/January issue; from those, our readers have chosen TestKompress ATPG Tool from Mentor Graphics as the 2009 Test of Time award recipient.
| Audio/video and multimedia Multimedia Test System VI Technology Board and system test and configuration Cover-Extend Technology Agilent Technologies Boundary scan JT 37x7 Rack-Mountable Instrument JTAG Technologies Data acquisition Wi-Fi Data Acquisition Devices National Instruments EDA/DFx/Test data-analysis software Global Test Operations Solution OptimalTest General-purpose instruments (non-oscilloscopes) 287 True-rms Electronics Logging Multimeter Fluke Machine vision and inspection OptiCon TurboLine AOI System GOEPEL electronic Network physical-layer test MW90010A Coherent OTDR Anritsu | Oscilloscopes WavePro 7 Zi LeCroy Protocol analyzers TestCenter 3000 Series Module* Spirent Communications RF/microwave instruments: Application/standard specific DigRF V4 Exerciser/Analyzer Agilent Technologies RF/microwave instruments: General purpose 6.6 GHz PXI Express RF Modular Instruments National Instruments Semiconductor test EDGE Flicker Noise Measurement System Cascade Microtech Test accessories and interconnects W2630A Series DDR2 and DDR3 BGA Probes Agilent Technologies Test-development and test-management software VEE Pro 9.0 Agilent Technologies |
Wi-Fi Data Acquisition Device
National Instruments www.ni.com
The Wi-Fi Data Acquisition (DAQ) devices are a family of wireless measurement devices that make it easy to set up and acquire wireless measurements without compromising on the security or performance of a cabled solution. The devices combine IEEE 802.11 wireless or Ethernet communication, direct sensor connectivity, and LabView software for remote real-time monitoring and instantaneous analysis of electrical, physical, mechanical, and acoustical dynamic signals.
Wi-Fi DAQ devices can stream data on each channel at rates of more
than 50 ksamples/s with 24 bits of resolution. In addition,
built-in NIST-approved 128-bit AES encryption and advanced network
authentication methods offer the highest commercially available
network security, according to NI.
With Wi-Fi DAQ, you can easily incorporate secure wireless connectivity into PC-based measurement or control systems as well as remote monitoring applications. Engineers can also leverage Wi-Fi DAQ C Series I/O modules interchangeably with NI’s CompactDAQ, CompactRIO, and single-module USB carriers.
The Wi-Fi DAQ product family comprises five wireless device models and numerous accessories, with prices starting at $699.
TestKompress ATPG Tool
Mentor Graphics www.mentor.com
The TestKompress ATPG (automatic test-pattern generation) tool includes embedded test compression for delivering high-quality scan test while lowering cost. As test requirements grow, compression is needed to keep high-quality testing of ICs feasible within a high-throughput production environment. It simply isn’t possible to apply test vectors to an advanced technology IC without it.
With TestKompress, test access I/O can be reduced to three pins,
thereby facilitating multisite testing, increasing device packaging
options, and streamlining modular design techniques. Its EDT
(Embedded Deterministic Test) technology gives consistent results
for design types ranging from microprocessors to automotive
electronics, without any loss of fault coverage.
TestKompress was introduced by adding pattern compression
capability to the FastScan ATPG engine in 2001. Initial compression
levels of 10X have evolved to levels exceeding 100X. Added features
include distributed processing for faster execution and direct
failure diagnosis without the need for special patterns. Designs
can employ multiple compression levels so testing is optimized for
wafer test, package test, and burn-in. A vectorless test, LBIST
(logic built-in self-test), can be added to enable a thorough
system test while the device is in the end application.
Test Engineer of the Year
PLANO, TX—Chronic pain sufferers may soon find relief, thanks to advances
undertaken by the St. Jude Medical Neuromodulation Division. Those
who benefit from the company’s latest product—the Eon Mini
device—will owe a portion of their gratitude to Eddie Abshire, who
brought to the project his skills in testing embedded software and
hardware as well as his tenacity in identifying and solving system
problems. Because of his accomplishments, Abshire was nominated for
the 2009 Test Engineer of the Year award and was voted as the
winner by the readers of Test & Measurement World.
Ninety million people in the US suffer from chronic pain, often associated with failed back surgery. While many patients resort to medication, which can lead to dependency, an increasing number now get effective relief from implanted pacemaker-like devices that deliver neurostimulation to control the pain.
ANS, a division of St. Jude Medical, this year gained FDA approval for the Eon Mini, said to be the world’s smallest neurostimulator for such applications. Slightly larger than a silver dollar, the device is more comfortable for patients and requires a smaller incision. A key figure in that development effort was Eddie Abshire.
The senior test engineer, whose 21-year career includes work in missile systems for Texas Instruments, helped verify low-level firmware and electrical circuitry of the Eon Mini early in the project and worked closely with chief engineers to characterize the functionality of the implant and uncover problem areas. He then leveraged this knowledge to develop system-level tests to ensure correct functionality between the implant, charger system, and programming software.
Managers at ANS praise Abshire’s skills in testing embedded software and hardware, as well as his tenacity in identifying and solving problems. Now, ANS is putting his talents to work on a new neurostimulation therapy for those suffering from depression. Said Abshire: "There’s tremendous gratification in seeing a medical product getting into the marketplace and helping people."
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