2182A: The Precise Key to Exploring the Nanovolt World
Core Performance and Technical Features:
Exceptional Measurement Sensitivity and Low Noise
Offers a wide voltage measurement range from 1 nV to 120 V. In the 1 nV range, typical noise is as low as 25 nV p‑p, enabling stable resolution of extremely weak voltage signals.
Utilizes low‑thermal‑EMF switches and chopper‑stabilized amplifier technology to effectively suppress errors caused by temperature gradients and amplifier drift.
Dual‑Channel Measurement and Differential Functionality
Provides two independent input channels. Each channel can be measured individually or configured in differential mode to directly measure the voltage difference between the two channels, which is highly effective in eliminating common‑mode noise.
Supports direct subtraction of Channel 1 – Channel 2, particularly useful for measurements requiring background noise or fixed offset cancellation.
Flexible Scanning and Harmonic Rejection Functions
Built‑in scanning function enables automatic switching between internal channels or coordination with external scanners for multi‑point voltage measurements.
Includes line‑frequency harmonic rejection filters (50 Hz/60 Hz and their harmonics) to significantly reduce power‑line interference, especially practical in industrial environments.
Powerful System Integration and Temperature Measurement
Standard interfaces include GPIB (IEEE‑488) and RS‑232, with SCPI command support for easy remote control and automated integration.
Optional temperature measurement capability allows synchronous temperature monitoring via thermocouples while measuring weak voltages.
Often paired with Keithley 6220/6221 current sources to form a complete system for measuring the resistivity and Hall effect of low‑resistance materials.
Typical Application Scenarios
Low‑Resistance Material and Contact Resistance Measurement: Used with precision current sources to measure extremely low resistances (down to the nΩ level) of superconducting materials, metal thin films, conductive pastes, etc.
Thermoelectric Effect and Seebeck Coefficient Research: Precisely measures the weak thermal voltages generated in materials due to temperature differences.
Sensor Output Measurement: Calibrates minute voltage changes from highly sensitive strain gauges, bolometers, etc.
Standard Voltage Transfer and Comparison: Used in metrology for comparing voltage standards at the microvolt level.
Professional Metrology‑Grade Calibration Ensures Nanovolt‑Level Measurement Reliability
The measurement accuracy of the 2182A is highly susceptible to test‑cable thermal EMFs, environmental electromagnetic interference, and drift of the instrument's own preamplifier. Its internal reference and amplifier performance require periodic highest‑grade calibration in a controlled environment.
Shenzhen Bao'an District Shajing Fangfengrui Instrument & Equipment Business Department provides key support in this area:
Nanovolt‑Level Voltage Measurement Accuracy Calibration: Uses traceable ultra‑low‑thermal‑EMF voltage standards or calibrators to precisely calibrate the 2182A’s measurement accuracy from the nV range to the V range, with a focus on linearity and noise levels in the low ranges.
Channel Matching and Differential Mode Verification: Calibrates the gain matching of the two input channels and verifies the accuracy of the differential measurement mode.
Filter and Scan Function Verification: Validates the effectiveness of line‑frequency rejection filters and the thermal EMF and contact resistance of internal scan switches.
System Noise and Stability Assessment: Measures the instrument's baseline noise and short‑term stability across different ranges and filter settings.
Fault Diagnosis and Deep Maintenance: Performs professional diagnosis and repair of issues such as excessive zero drift, unstable readings, range‑switching errors, significant channel discrepancies, and communication failures, with particular attention to input relays and preamplifier maintenance.
Conclusion
The Keithley 2182A Nanovoltmeter, with its near‑limit performance in measuring weak DC voltages, has become an indispensable core instrument in fields such as condensed matter physics, materials science, and precision metrology. It transforms the measurement of nanovolt‑level signals from a challenge into a routine task.
Ensuring that this precise key can consistently and stably unlock the door to the nanovolt world requires extreme professional rigor and attention to detail. By partnering with a professional service provider like the Shenzhen Bao'an District Shajing Fangfengrui Instrument & Equipment Business Department, researchers and metrologists can obtain comprehensive support—from metrology‑grade calibration and environmental assessment to in‑depth maintenance—for their critical measurement systems. This ensures that every nanovolt‑level data point obtained at the forefront of exploring intrinsic material properties is solid and trustworthy.
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