吉时利2636B 双通道系统源表：高功率双通道测试的集成化专业平台

2636B: The Core Driver for High-Power Dual-Channel Testing

Core Performance and Technical Features:

Integrated High-Power Dual-Channel Design

Integrates two completely independent high-power Source Measure Unit (SMU) channels in a single mainframe. Each channel provides ±40 V / ±10 A (DC) or ±20 V / ±10 A (pulsed) sourcing/sinking capability. The maximum power per channel is 100 W, with a system total power of 200 W.

Each channel features 6½‑digit (22‑bit) ADC measurement resolution with current measurement sensitivity down to 100 pA, balancing high‑power output with low‑level signal measurement capability.

Four‑quadrant operation enables precise sourcing and sinking of power for complete device characterization.

Excellent Test Flexibility and Speed

Supports TSP® (Test Script Processor) technology. Test scripts run directly on the instrument’s internal processor, eliminating GPIB bus latency and enabling high‑speed, deterministic test‑sequence execution to improve test throughput.

The two channels can operate completely independently for parallel testing of two separate devices or be precisely synchronized for dual‑port testing of a single device (e.g., transistor characterization).

Powerful System Expansion and Synchronization Capability

Via the TSP‑Link® high‑speed expansion bus, multiple 2636B units (or other TSP‑compatible Keithley instruments) can be easily synchronized and interconnected to build ultra‑large‑scale high‑power parallel test systems, all coordinated by a single master script.

This architecture is particularly suitable for high‑throughput multi‑site testing of power devices in production lines.

Comprehensive Protection and Industrial‑Grade Design

Includes comprehensive over‑voltage, over‑current, and over‑temperature protection to safeguard both the high‑power device under test and the instrument itself.

Rugged 2U‑high, half‑rack design with powerful cooling fans, suitable for long‑term, high‑load operation in standard ATE racks.

Typical Application Scenarios:

Power Device Characterization and Sorting: Static parameter testing (e.g., VCE(sat), VF, ICES), Safe Operating Area (SOA) scanning, and production‑line sorting for IGBTs and power MOSFETs.

High‑Brightness LED and Laser Diode Testing: L‑I‑V (Light‑Current‑Voltage) characterization to evaluate optoelectronic performance.

Battery and Power Module Testing: Charge‑discharge characteristic testing and internal resistance measurement for battery cells or modules.

Dual‑Port High‑Power Device R&D: Comprehensive DC characteristic analysis of devices requiring synchronized high‑power biasing on two ports.

Professional System‑Level Services Ensure Reliability in High‑Power Testing

For the 2636B, service focus extends beyond accuracy calibration to ensuring its stability, inter‑channel isolation, thermal efficiency, and synchronization in multi‑unit expansions under high‑power, high‑current operating conditions.

The Shenzhen Bao'an District Shajing Fangfengrui Instrument & Equipment Business Department provides key support in this area:

High‑Power Range Precision Calibration: Precise full‑range calibration (especially in high‑current ranges) and load‑regulation testing of each SMU channel’s voltage source/meter and current source/meter under full‑power load conditions.

Inter‑Channel Isolation and Crosstalk Testing: Verifies electrical isolation between the two channels during high‑power output to ensure accuracy in independent testing.

Thermal‑System Inspection and Maintenance: Cleaning of cooling pathways, checking fan performance, and evaluating temperature rise during long‑term, high‑load operation to prevent performance degradation or failure due to overheating.

TSP‑Link Expanded System Alignment and Synchronization Calibration: System‑level synchronization‑accuracy calibration and overall performance verification for large‑scale test systems built from multiple 2636B units.

Fault Diagnosis and In‑Depth Repair: Systematic diagnosis and professional repair of issues such as abnormal power output, overload protection, measurement drift, channel failure, communication faults, and thermal problems.

Conclusion

The Keithley 2636B Dual‑Channel System SourceMeter occupies a key position in the testing of high‑power electronic devices, thanks to its unique integrated high‑power dual‑channel design, TSP architecture optimized for automated testing, and powerful system‑expansion capability. It combines high‑power excitation, precision measurement, and high‑speed testing in a single instrument, making it critical for improving R&D and production efficiency in power electronics.

Ensuring that this “high‑power test engine” operates stably, accurately, and reliably over the long term in demanding production‑line or R&D environments requires professional services with composite knowledge of power electronics, precision measurement, and system integration. By partnering with a professional service provider like the Shenzhen Bao'an District Shajing Fangfengrui Instrument & Equipment Business Department, users can secure full‑lifecycle technical support—from single‑unit calibration and thermal optimization to multi‑unit synchronization and preventive maintenance—gaining both quality and efficiency advantages in the field of power electronics.

吉时利2636B 双通道系统源表：高功率双通道测试的集成化专业平台

在功率半导体器件（如IGBT、功率MOSFET）、高亮度LED、大功率激光二极管及电池模块的研发与测试中，需要能够提供高电压、大电流激励并同步进行精密测量的双通道解决方案。吉时利（Keithley，现为是德科技旗下品牌）2636B 双通道系统源表（SourceMeter®） 以其集成的双高功率通道、卓越的源与测量精度以及灵活的系统扩展性，成为高功率、双端口测试应用的理想选择。

为确保此类高功率、高密度测试仪器持续提供稳定、精确的性能，专业的系统级校准、散热管理及维护支持不可或缺。深圳市宝安区沙井方丰瑞仪器设备经营部在高功率源表系统服务领域具备专业能力，可为2636B用户提供全面的技术支持与服务保障。

2636B：高功率双通道测试的核心动力

核心性能与技术特点：

集成的高功率双通道设计

单个主机内集成 两个完全独立的高功率源测量单元（SMU）通道，每通道提供 ±40 V / ±10 A（直流） 或 ±20 V / ±10 A（脉冲） 的源/阱能力，单通道最大功率高达100W，系统总功率200W。

每通道均具备 6½位（22-bit）ADC 测量分辨率，电流测量灵敏度达 100 pA，兼顾高功率输出与微弱信号测量能力。

四象限工作，可精确输出与吸收功率，完整表征器件特性。

卓越的测试灵活性与速度

支持 TSP®（测试脚本处理器）技术。测试脚本在仪器内部处理器直接运行，消除GPIB总线延迟，实现高速、确定性的测试序列执行，提升测试吞吐量。

双通道可 完全独立工作，用于并行测试两个独立器件；也可 精确同步工作，用于单器件的双端口测试（如晶体管特性测试）。

强大的系统扩展与同步能力

通过 TSP-Link® 高速扩展总线，可轻松将多台2636B（或其他支持TSP的吉时利仪器）同步互联，构建超大规模的 高功率并行测试系统，所有仪器由单一主控脚本协调。

这种架构特别适合功率器件产线的高吞吐量多站点测试。

完善的保护与工业级设计

具备完善的过压、过流、过温保护功能，保障被测高功率器件和仪器自身安全。

坚固的 2U高半机架 设计，配备强力散热风扇，适合集成到标准ATE机柜中长期高负荷运行。

典型应用场景

功率器件特性测试与分选：用于IGBT、功率MOSFET的静态参数（如VCE(sat)、VF、ICES）测试、安全工作区（SOA）扫描及产线分选。

高亮度LED与激光二极管测试：进行L-I-V特性（光强-电流-电压）测试，评估光电性能。

电池与电源模块测试：对电池单体或模块进行充放电特性测试、内阻测量。

双端口高功率器件研发：对需要双端口同步施加高功率偏置的器件进行全面的直流特性分析。

专业系统级服务保障高功率测试的可靠性

对于2636B，服务重点不仅在于精度校准，更在于确保其在高功率、大电流工作状态下的 稳定性、通道间隔离度、散热效能以及多机扩展后的同步性。

深圳市宝安区沙井方丰瑞仪器设备经营部在此领域能够为用户提供关键支持：

高功率量程精密校准：在满功率负载条件下，对每个SMU通道的电压源/表、电流源/表进行全量程（尤其是高电流档）的精密校准与负载调整率测试。

通道间隔离与串扰测试：验证在高功率输出时，两个通道之间的电气隔离度，确保独立测试的准确性。

散热系统检测与维护：清洁散热风道，检查风扇性能，评估长期高负荷运行下的温升情况，预防因过热导致的性能下降或故障。

TSP-Link扩展系统联调与同步校准：对由多台2636B构建的大型测试系统进行系统级同步精度校准和整体性能验证。

故障诊断与深度维修：对功率输出异常、过载保护、测量漂移、通道失效、通讯故障、散热问题等进行系统化诊断与专业维修。

结语

吉时利2636B双通道系统源表凭借其独特的高功率双通道集成设计、为自动化测试优化的TSP架构和强大的系统扩展能力，在高功率电子器件的测试领域占据了重要地位。它将高功率激励、精密测量和高速测试能力融为一体，是提升功率器件研发与生产效率的关键设备。

确保这一“高功率测试引擎”在严苛的产线或研发环境中长期稳定、精确、可靠地运行，需要具备功率电子、精密测量和系统集成复合知识的专业服务。与 深圳市宝安区沙井方丰瑞仪器设备经营部 这样的专业服务伙伴合作，用户可以确保其2636B系统获得从单机校准、散热优化、多机联调到预防性维护的全生命周期技术保障，从而在功率电子领域赢得质量与效率的双重优势。