1. AABUS: As Agreed Upon Between User
and Supplier
由供需双方协商确定
2. ASIC: Applications Specific IC
专用集成电路
3. ASM: Array Surface Mount
阵列表面贴装
4. ASMP: Application Specific Module Packaging
专用模块封装
5. AXI: Automatic X-Ray Inspection
自动X射线检查
6. BGA: Ball Grid Array
球栅阵列
7. BOC: Board-On-Chip
芯片上板子直装
8. BT: Bismaleimide-Triazine
双马来酰亚胺三嗪
9. CAGE: Commercial and Government Entity
商业及政府机构
10. CBGA: Ceramic Ball Grid Array
陶瓷球栅阵列
11. CCGA: Ceramic Column Grid Array
陶瓷柱栅阵列
12. CGA: Column Grid Array
柱栅阵列
13. COB: Chip-On-Board
板上芯片直装
14. CPU: Central Processing Unit
中央处理器
15. CSP: Chip Scale Packages
芯片尺寸封装
16. CTE: Coefficient of Thermal Expansion
热膨胀系数
17. CTF: Critical To Function
关键功能
18. DBDPE: Decabromodiphenyl Ether
十溴联苯醚
19.DDR-SDRAM:Double-Data-Rate Synchronous
Dynamic Random Access Memory
双倍速率同步动态随机存取存储器
20.Df: Dissipation Factor
损耗因子
21.DfM: Design for Manufacturability
可制造性设计
22.DfR: Design for Reliability
可靠性设计
23. DIG: Direct Immersion Gold
直接浸金
24. Dk: Dielectric Constant
介电常数
25. DMA: Dynamic Mechanical Analysis
动态力学分析
26. DSBGA: Die-Size Ball Grid Array
芯片尺寸球栅阵列
27. DSC: Differential Scanning Calorimetry
差分扫描热量测定法
28. DSP: Die Size Package
芯片尺寸封装
29. dT: Temperature Differential
温差
30. ECM: Electrochemical Migration Test
电化学迁移测试
31. ENEPIG: Electroless Nickel/Electroless
Palladium/Immersion Gold
化学镀镍/化学镀钯/浸金
32. ENIG: Electroless Nickel Immersion Gold
化学镀镍浸金
33. ESD: Electrostatic Discharge/
Electrostatic Device
静电放电/静电装置
34. ESS:Environmental Stress Screening
环境应力筛选
35. EU: European Union
欧盟
36. FAT: Flux Activation Time
助焊剂活化时间
37. FBGA: Fine Pitch Ball Grid Array
密节距球栅阵列
38. FC: Flip Chip
倒装芯片
39. FPT: Fine Pitch Technology
密节距技术
40. FRBGA: Fine-Pitch, Rectangular Ball Grid Array
密节距,矩形球栅阵列
41. FT: Functional Test
功能测试
42. GAC: Grid Array Component
格栅阵列器件
43. HASL: Hot Air Solder Level
热风焊料整平
44. HAST: Highly Accelerated Stress Testing
高加速应力测试
45. HCI: Hydrochloric
氯化氢的
46. HDB: High Density Printed Boards
高密度印制板
47. HF: Hydrofluoric
氢氟酸的
48. HoP: Head-on-Pillow
枕头效应
49. I/O: Input/Output
输入/输出
50. ICT: In-Circuit Test
在线测试
51. ILC: Independent Loading Mechanism
独立加载机构
52. IMC: Intermetallic Compound
金属间化合物
53. IR: Infrared
红外线
54. LCP: Liquid Crystal Polymer
液晶聚合物
55. LFBGA: Low-Profile Fine-Pitch Ball Grid Array
小外形密节距球栅阵列
56. LMC: Least Material Condition
最小实体条件
57. LTD: Liquidus Time Delay
液相时间延迟
58. MCM: Multichip Module
多芯片模块
59. MCM-L: Multichip Module-Laminate
多芯片模块-层压板
60. MCP: Multichip Package
多芯片封装
61. MD: Metal Defined
金属限定
62. MDA: Manufacturing Defect Analyzer
制造缺陷分析仪
63. MDS: Multi Device Subassembly
多器件子组件
64. MLC: Multilayer Ceramic
多层陶瓷
65. MMB: Moisture Membrane Bag
湿薄膜袋
66. MMC: Maximum Material Condition
最大实体条件
67. NAND: Not “And”
非“与”
68.NSMD: Nonsolder Mask Defined
非阻焊膜限定
69. OEM: Original Equipment Manufacturer
原始设备制造商
70. OSP: Organic Solderability Preservative
有机可焊性保护剂
71. PBB: Polybrominated Biphenyl
多溴化联苯
72. PBBO: Polybrominated Biphenyl Oxide
多溴化联苯氧化物
73. PBDE: Polybrominated Diphenyl Ether
多溴二苯醚
74. PBGA: Plastic Ball Grid Array
塑封球栅阵列
75. PCA: Printed Circuit Assembly
印制电路组件
76. PCB: Printed Circuit Board
印制电路板
77. PCM: Phase Change Materials
相变材料
78. PCMCIA: Personal Computer Memory Card
International Association
个人计算机存储卡国际协会
79. PGA: Pin Grid Array
针栅阵列
80. PLCC: Plastic Leaded Chip Carrier
塑料有引线芯片载体
81. PSA: Pressure Sensitive Adhesives
压敏粘合剂
82. PTH: Plated Through-Hole
镀通孔
83. QFP: Quad Flat Pack
方形扁平封装
84. RDS: Rectangular Die Size
矩形芯片尺寸
85. RF: Radio Frequency
射频
86. RFID: Radio Frequency Identification
射频识别
87. RMS: Root Mean, Square
均方根
88. RoHS: Restriction of Hazardous Substances
有害物质限制
89. RSS: Ramp-Soak-Spike
升温-保温-峰值
90. RTS: Ramp-to-Spike
升温至峰值
91. SAC: Sn/Ag/Cu
锡/银/铜
92. SDRAM: Synchronous Dynamic Random
Access Memory
同步动态随机访问存储器
93. SGA: Solder Grid Array
焊料栅格阵列
94. SIR: Surface Insulation Resistance
表面绝缘电阻
95. SMD: Solder Mask Defined
阻焊膜限定
96. SMOBC: Solder Mask Over Bare Copper
裸铜覆阻焊膜
97. SMT: Surface Mounting Technology
表面贴装技术
98. SO-DIMM: Small Outline Dual In-Line
Memory Module
小外形双列直插存储模块
99. SOIC: Small Outline Integrated Circuit
小外形集成电路
100. SPC: Statistical Process Control
统计过程控制
101. SRAM: Static Random Access Memory
静态随机存取存储器
102. SSO: Simultaneously Switching Output
同步开关输出
103. STII: Soldering Temperature Impact Index
焊接温度影响指数
104. TAB: Tape-Automated Bonding
载带自动键合
105. TAL: Time Above Liquidus
液相线上时间
106. TBBPA: Tetrabromobisphenol A
四溴双酚A
107. TBGA: Tape Ball Grid Array
载带球栅阵列
108. Td: Decomposition Temperature
分解温度
109. TFBGA: Thin Profile Fine Pitch Ball Grid Array
薄外形细节距球栅阵列
110. Tg: Transition Temperature
转变温度
111. TIM: Thermal Interface Materials
热界面材料
112. TMA: Thermal Mechanical Analysis
热机械分析
113. UFPT: Ultra Fine Pitch Technology
超密节距技术
114. UtRAM: Uni-transistor Random Access Memory
单一晶体管随机存取存储器
115. UUT: Unit Under Test
被测单元
116. UV: Ultraviolet
紫外线
117. VFBGA: Very Thin-Profile Fine-Pitch Ball
Grid Array
极薄外形细节距球栅阵列
118. WEEE: Waste in Electrical and Electronic
Equipment
废弃电子电器设备
119. ZIF: Zero Insertion Force
零插拔力
850